Optics: measuring and testing – Of light reflection – With diffusion
Reexamination Certificate
2008-04-08
2008-04-08
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
Of light reflection
With diffusion
C356S326000, C356S445000, C356S451000, C385S004000, C385S012000, C385S014000
Reexamination Certificate
active
11615886
ABSTRACT:
A method for inspecting a grating biochip comprises the steps of irradiating a grating biochip using a light beam, measuring a diffracted light using a photodetector, selecting a plurality of parameters of the grating biochip, and optimizing the parameters to enhance the detection sensitivity, wherein the diffracted light is generated by the light beam passing the grating biochip. The grating biochip comprises a grating structure including a semiconductor substrate, a grating positioned on the semiconductor substrate and a dielectric layer covering the grating and the semiconductor substrate. The sample of the biochip is positioned on the grating structure.
REFERENCES:
patent: 2003/0113766 (2003-06-01), Pepper et al.
patent: 2006/0193550 (2006-08-01), Wawro et al.
Ko Chun Hung
Ku Yi Sha
Shyu Deh Ming
Smith Nigel
Accent Optical Technologies, Inc.
Alli Iyabo S
Industrial Technology Research Institute
King Anthony
Lauchman Layla G.
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