Method for increasing retention time in DRAM

Static information storage and retrieval – Systems using particular element – Capacitors

Reexamination Certificate

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C365S203000, C365S104000

Reexamination Certificate

active

07663908

ABSTRACT:
The disclosure generally relates to a method and apparatus for decreasing the frequency of refreshing a memory cell in communication with a word line and a bit line. A method according to one embodiment includes: providing a DRAM circuit having a memory cell, a sense amplifier including a pre-charge circuit connected to a first voltage source and a back-to-back inverter including a first NMOS transistor having a source, a second NMOS transistor having a source, a first PMOS transistor having a source and a second PMOS transistor having a source; maintaining the voltage of the sources of the first and second PMOS transistors at a first voltage during normal operation; and raising the voltage of the sources of the first and second PMOS transistors from the first voltage to a second voltage during a refresh operation.

REFERENCES:
patent: 5659260 (1997-08-01), Kajimoto et al.
patent: 6205049 (2001-03-01), Lien et al.
patent: 6411160 (2002-06-01), Riho et al.
patent: 6728151 (2004-04-01), Joo
patent: 6961278 (2005-11-01), Jeong
patent: 2003/0174533 (2003-09-01), Ito
patent: 2007/0133327 (2007-06-01), Huang
patent: 2007/0268764 (2007-11-01), Kim et al.
patent: 2002045959 (2002-06-01), None

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