Method for implementing eFuse sense amplifier testing...

Static information storage and retrieval – Read/write circuit – Testing

Reexamination Certificate

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C365S205000, C365S203000, C365S225700

Reexamination Certificate

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07489572

ABSTRACT:
A method implements effective testing of a sense amplifier for an eFuse without having to program or blow the eFuse. After initial processing of the sense amplifier, testing determines whether the sense amplifier can generate a valid “0” and “1” before programming the eFuse. A first precharge device and a second precharge device that normally respectively precharge a true sense node and a complement sense node to a high voltage are driven separately. For testing, one of the precharge devices is conditionally held off to insure the sense amplifier results in a “0” and “1”. This allows the testing of the sense amplifier devices as well as down stream connected devices. Once testing is complete, both precharge devices are controlled in tandem.

REFERENCES:
patent: 7224633 (2007-05-01), Hovis et al.

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