Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
Reexamination Certificate
2008-07-01
2008-07-01
Toledo, Fernando L. (Department: 2823)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Ion implantation of dopant into semiconductor region
C257SE21618, C438S289000, C438S291000, C438S514000
Reexamination Certificate
active
07393767
ABSTRACT:
A method for implanting a cell channel ion of semiconductor device is disclosed. In accordance with the method, the bit line contact region and the edge portion of the channel region adjacent to the bit line contact region in the cell region are subjected to a selective cell channel implant process two times using a ion implant mask and rest of the cell region is subjected to cell channel implant process only once so that a impurity concentration of the storage node contact region is maintained at a lower level for minimal leakage current in the storage node contact region.
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Lee Won Chang
Sun Woo Kyung
Hynix / Semiconductor Inc.
Stark Jarrett J
Toledo Fernando L.
Townsend and Townsend / and Crew LLP
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