Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-10-02
2010-02-16
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C702S118000, C700S121000, C324S764010, C438S014000
Reexamination Certificate
active
07665049
ABSTRACT:
In the manufacturing process of a semiconductor integrated circuit device, a plurality of identification elements having the same arrangement are formed and the relation of magnitude in a physical amount corresponding to variations in the process of the plurality of identification elements is employed as identification information unique to the semiconductor integrated circuit device.
REFERENCES:
patent: 4302491 (1981-11-01), Papageorgiou
patent: 4344064 (1982-08-01), Bitler et al.
patent: 5103166 (1992-04-01), Jeon et al.
patent: 5380998 (1995-01-01), Bossen et al.
patent: 5386623 (1995-02-01), Okamoto et al.
patent: 5617364 (1997-04-01), Hatakeyama
patent: 5768290 (1998-06-01), Akamatsu
patent: 5804980 (1998-09-01), Nikawa
patent: 5843797 (1998-12-01), Iuchi
patent: 5983331 (1999-11-01), Akamatsu et al.
patent: 6063695 (2000-05-01), Lin et al.
patent: 6161052 (2000-12-01), Charlton et al.
patent: 6161213 (2000-12-01), Lofstrom
patent: 6278193 (2001-08-01), Coico et al.
patent: 6289292 (2001-09-01), Charlton et al.
patent: 6415339 (2002-07-01), Farmwald et al.
patent: 7119662 (2006-10-01), Horiguchi et al.
patent: 2002/0017708 (2002-02-01), Takagi et al.
patent: 2003/0017652 (2003-01-01), Sakaki et al.
patent: 56-50526 (1981-05-01), None
patent: 64-37847 (1989-02-01), None
patent: 1-100943 (1989-04-01), None
patent: 1-269299 (1989-10-01), None
patent: 4-369750 (1992-12-01), None
patent: 5-67683 (1993-03-01), None
patent: 6-196435 (1994-07-01), None
patent: 6-291170 (1994-10-01), None
patent: 7-50233 (1995-02-01), None
patent: 7-335509 (1995-12-01), None
patent: 8-29493 (1996-02-01), None
patent: 8-213464 (1996-08-01), None
patent: 10-55939 (1998-02-01), None
patent: 11-214274 (1999-08-01), None
Hitachi , Ltd.
Hitachi ULSI Systems Co. Ltd.
Miles & Stockbridge P.C.
Whitmore Stacy A
LandOfFree
Method for identifying semiconductor integrated circuit... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for identifying semiconductor integrated circuit..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for identifying semiconductor integrated circuit... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4168124