Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2007-10-16
2007-10-16
Geyer, Scott B. (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C257S678000
Reexamination Certificate
active
11194487
ABSTRACT:
In the manufacturing process of a semiconductor integrated circuit device, a plurality of identification elements having the same arrangement are formed and the relation of magnitude in a physical amount corresponding to variations in the process of the plurality of identification elements is employed as identification information unique to the semiconductor integrated circuit device.
REFERENCES:
patent: 4302491 (1981-11-01), Papageorgiou
patent: 4344064 (1982-08-01), Bitler et al.
patent: 5103166 (1992-04-01), Jeon et al.
patent: 5380998 (1995-01-01), Bossen et al.
patent: 5386623 (1995-02-01), Okamoto et al.
patent: 5617364 (1997-04-01), Hatakeyama
patent: 5768290 (1998-06-01), Akamatsu
patent: 5804980 (1998-09-01), Nikawa
patent: 5843797 (1998-12-01), Iuchi
patent: 5983331 (1999-11-01), Akamatsu et al.
patent: 6063695 (2000-05-01), Lin et al.
patent: 6161052 (2000-12-01), Charlton et al.
patent: 6161213 (2000-12-01), Lofstrom
patent: 6278193 (2001-08-01), Coico et al.
patent: 6289292 (2001-09-01), Charlton et al.
patent: 6415339 (2002-07-01), Farmwald et al.
patent: 7119662 (2006-10-01), Horiguchi et al.
patent: 2002/0017708 (2002-02-01), Takagi et al.
patent: 2003/0017652 (2003-01-01), Sakaki et al.
patent: 56-50526 (1981-05-01), None
patent: 64-37847 (1989-02-01), None
patent: 1-100943 (1989-04-01), None
patent: 1-269299 (1989-10-01), None
patent: 4-369750 (1992-12-01), None
patent: 5-67683 (1993-03-01), None
patent: 6-196435 (1994-07-01), None
patent: 6-291170 (1994-10-01), None
patent: 7-50233 (1995-02-01), None
patent: 7-335509 (1995-12-01), None
patent: 8-29493 (1996-02-01), None
patent: 8-213464 (1996-08-01), None
patent: 10-55939 (1998-02-01), None
patent: 11-214274 (1999-08-01), None
Geyer Scott B.
Hitachi , Ltd.
Hitachi ULSI Systems Co. Ltd.
Miles & Stockbridge P.C.
Stevenson Andre′
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