Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-06-21
2011-06-21
Valone, Thomas (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07965090
ABSTRACT:
A method for identifying connected devices and an electronic device using the method are disclosed. When the connected device is connected to the electronic device, a type of the connected device is identified based on the voltage change according to a change of current flowing in therebetween, and then a corresponding function is performed based on the identified type.
REFERENCES:
patent: 6948000 (2005-09-01), Desai et al.
patent: 7072360 (2006-07-01), Dravida et al.
patent: 7231540 (2007-06-01), Morimoto et al.
patent: 2002/0124111 (2002-09-01), Desai et al.
Jefferson IP Law, LLP
Samsung Electronics Co,. Ltd.
Valone Thomas
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