Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-09-06
2005-09-06
Chen, Jack (Department: 2813)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S640000
Reexamination Certificate
active
06939798
ABSTRACT:
A method is provided for forming a conductive wire of a semiconductor device using, for example, a damascene process. A conductive wire, such as a metal wire, is formed, based on a notching phenomenon which occurs when the etching selectivity between a polycrystalline silicon layer and a lower film is approximately 5 to 500:1.
REFERENCES:
patent: 6528363 (2003-03-01), Ku et al.
patent: 1992-0013606 (1992-07-01), None
Notice of Preliminary Rejection from the Korean Intellectual Property Office dated Jun. 30, 2003, with English translation.
Chen Jack
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Hynix / Semiconductor Inc.
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