Method for forming patterns using single mask

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

Reexamination Certificate

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Details

C430S005000, C430S030000, C430S324000

Reexamination Certificate

active

07993814

ABSTRACT:
A method for forming patterns using a single mask includes: disposing a photo mask having a defined pattern, and performing an exposure process by controlling the focal length of an exposure apparatus to a focusing position to form a pattern having the same shape as the photo mask on the wafer; and using the same photo mask, and performing the exposure process by controlling the focal length of the exposure apparatus to a defocusing position to form a reverse pattern having a reversed image with respect to the pattern on the wafer.

REFERENCES:
patent: 6597001 (2003-07-01), Yamashita et al.
patent: 2003/0224252 (2003-12-01), Zhou et al.
patent: 2004/0032581 (2004-02-01), Nikoonahad et al.
patent: 2004/0081899 (2004-04-01), Misaka
patent: 2006/0181691 (2006-08-01), Moukara et al.
patent: 2006/0183030 (2006-08-01), Nakao
patent: 07-140642 (1995-06-01), None
patent: 2005-005489 (2005-01-01), None
patent: 10-2003-008214 (2003-01-01), None
patent: 463232 (2001-11-01), None

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