Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2011-03-22
2011-03-22
Nhu, David (Department: 2895)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S246000, C438S389000, C438S510000, C438S692000, C257SE21042, C257SE21388, C257SE21051, C257SE21077, C257SE21267, C257SE21304, C257SE21435, C257SE21545, C257SE21546, C257SE21562
Reexamination Certificate
active
07910486
ABSTRACT:
A method for forming a semiconductor device includes forming a nanotube region using a thin epitaxial layer formed on the sidewall of a trench in the semiconductor body. The thin epitaxial layer has uniform doping concentration. In another embodiment, a first thin epitaxial layer of the same conductivity type as the semiconductor body is formed on the sidewall of a trench in the semiconductor body and a second thin epitaxial layer of the opposite conductivity type is formed on the first epitaxial layer. The first and second epitaxial layers have uniform doping concentration. The thickness and doping concentrations of the first and second epitaxial layers and the semiconductor body are selected to achieve charge balance. In one embodiment, the semiconductor body is a lightly doped P-type substrate. A vertical trench MOSFET, an IGBT, a Schottky diode and a P-N junction diode can be formed using the same N-Epi/P-Epi nanotube structure.
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Bhalla Anup
Chang Hong
Chen John
Wang Xiaobin
Yilmaz Hamza
Alpha & Omega Semiconductor, Inc.
Cook Carmen C.
Nhu David
Patent Law Group LLP
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