Method for forming interlayer insulating film in...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S725000

Reexamination Certificate

active

08048802

ABSTRACT:
A method for forming an interlayer insulating film includes providing a semiconductor substrate having a first substrate region with a plurality of metal wiring and a second substrate region having no metal wiring, and then forming an insulating film dummy pattern in the second substrate region, wherein the insulating film dummy pattern has the same thickness as the metal wiring, and then forming an interlayer insulating film over the semiconductor substrate including the insulating film dummy pattern.

REFERENCES:
patent: 5196089 (1993-03-01), Takada et al.
patent: 6487712 (2002-11-01), Kim
patent: 2003/0129548 (2003-07-01), Kido
patent: 10-144690 (1998-05-01), None
patent: 2000-082706 (2000-03-01), None

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