Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2008-08-25
2011-11-01
Loke, Steven (Department: 2818)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S725000
Reexamination Certificate
active
08048802
ABSTRACT:
A method for forming an interlayer insulating film includes providing a semiconductor substrate having a first substrate region with a plurality of metal wiring and a second substrate region having no metal wiring, and then forming an insulating film dummy pattern in the second substrate region, wherein the insulating film dummy pattern has the same thickness as the metal wiring, and then forming an interlayer insulating film over the semiconductor substrate including the insulating film dummy pattern.
REFERENCES:
patent: 5196089 (1993-03-01), Takada et al.
patent: 6487712 (2002-11-01), Kim
patent: 2003/0129548 (2003-07-01), Kido
patent: 10-144690 (1998-05-01), None
patent: 2000-082706 (2000-03-01), None
Dongbu Hi-Tek Co., Ltd.
Loke Steven
Sherr & Vaughn, PLLC
Thomas Kimberly M
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