Method for forming interconnection in semiconductor pattern devi

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438633, 438636, 438665, 438690, 438692, H01L 214763

Patent

active

057670137

ABSTRACT:
A method for forming an interconnection pattern in a semiconductor device for reducing metallic reflection, includes the steps of forming a conductive layer on a substrate, polishing the conductive layer to form a rugged surface on the conductive layer, and selectively removing the polished conductive layer to form the interconnection pattern.

REFERENCES:
patent: 5124780 (1992-06-01), Sandhu et al.
patent: 5219787 (1993-06-01), Carey et al.
patent: 5461007 (1995-10-01), Kobayashi
patent: 5534462 (1996-07-01), Fiordalice et al.
patent: 5563096 (1996-10-01), Nasr
patent: 5607718 (1997-03-01), Sasaki et al.
patent: 5639692 (1997-06-01), Teong

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for forming interconnection in semiconductor pattern devi does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for forming interconnection in semiconductor pattern devi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for forming interconnection in semiconductor pattern devi will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1725565

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.