Method for forming group-III nitride semiconductor layer and...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor

Reexamination Certificate

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Reexamination Certificate

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06841410

ABSTRACT:
A method of forming a partially etched nitride-based compound semiconductor crystal layer includes the following steps. A non-crystal layer of a nitride-based compound semiconductor is formed. At least a part of the non-crystal layer is then etched to form a partially etched non-crystal layer before the partially etched non-crystal layer is crystallized to form a partially etched nitride-based compound semiconductor crystal layer.

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M. Kuramoto et al., “Novel Ridge-type InGaN MQW Laser Diodes Fabricated by Selective Area re-growth on GaN Substrates”, The Institute of Electronics, Information and Communication Engineers, Technical Report of IEICE, LQE2001-29 (Jun. 2001), pp. 73-78.
Y. Arakawa et al., “Physics and Simulation of Optocelectronic Devices 1X”,Proceedings of SPIE, vol. 4283, (2001), pp. 58-66.

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