Method for forming fine grooves and stamper and structure...

Etching a substrate: processes – Masking of a substrate using material resistant to an etchant – Mask resist contains inorganic material

Reexamination Certificate

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C216S002000, C216S011000, C216S039000, C216S041000

Reexamination Certificate

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06974549

ABSTRACT:
A method for forming fine grooves including forming a first silicon-nitride layer on a substrate, forming a first poly-silicon layer on the first silicon-nitride layer, forming a second silicon-nitride layer on the first poly-silicon layer, patterning the second silicon-nitride layer, etching the first poly-silicon layer using the patterned second silicon-nitride layer as a mask, forming at least one patterned oxidized portion of the first poly-silicon layer by oxidizing the substrate, first silicon-nitride layer, etched first poly-silicon layer, and patterned second silicon-nitride layer, removing the patterned second silicon-nitride layer and etched first poly-silicon layer such that the first silicon-nitride layer and at least one patterned oxidized portion of the first poly-silicon layer remain on the substrate, and forming a plurality of fine grooves over the substrate by plasma etching the first silicon-nitride layer using the at least one patterned oxidized portion of the first poly-silicon layer as a mask.

REFERENCES:
patent: 4083098 (1978-04-01), Nicholas
patent: 4568410 (1986-02-01), Thornquist
patent: 5144552 (1992-09-01), Abe
patent: 5482885 (1996-01-01), Lur et al.
patent: 6063688 (2000-05-01), Doyle et al.
patent: 6429123 (2002-08-01), Tseng
patent: 2002/0094648 (2002-07-01), Lim et al.
patent: 5-3191 (1993-01-01), None
patent: 8-288499 (1996-11-01), None

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