Method for forming contact plug in semiconductor device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S629000, C438S647000, C438S672000, C438S675000, C438S565000

Reexamination Certificate

active

06844259

ABSTRACT:
The present invention provides a method for forming a contact plug in a semiconductor device capable of preventing an increase of contact resistance even if the contact size becomes smaller and degradation of a step coverage property and of suppressing a decrease of uniformity in the contact resistance. The inventive method includes the steps of: a method for forming a contact plug in a semiconductor device, comprising the steps of: forming a contact hole by etching an insulating layer on a substrate; forming a first silicon film with a first doping concentration on the substrate in the contact hole so that the contact hole is partially filled; flushing a doping gas on a surface of the first silicon film; and forming a second silicon film having a second doping concentration higher than the first doping concentration on the first silicon film until filling the contact hole.

REFERENCES:
patent: 5475257 (1995-12-01), Hashimoto et al.
patent: 6030894 (2000-02-01), Hada et al.
patent: 6187659 (2001-02-01), Ying et al.
patent: 6249010 (2001-06-01), Bergemont et al.
patent: 6268281 (2001-07-01), Shih et al.
patent: 6362023 (2002-03-01), Bergemont et al.
patent: 10-27847 (1998-01-01), None

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