Method for forming conductive lines and stacked vias

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438656, 438672, 438720, H01L 21441

Patent

active

057473838

ABSTRACT:
A method for fabricating an improved connection between active device regions in silicon, to overlying metallization levels, has been developed. A LPCVD tungsten contact plug process, which results in optimum coplanarity between the top surface of the tungsten plug and the surrounding insulator surface, has been created.

REFERENCES:
patent: 4398338 (1983-08-01), Tickle et al.
patent: 4592802 (1986-06-01), Deleonibus et al.
patent: 5010039 (1991-04-01), Ku et al.
patent: 5024722 (1991-06-01), Cathey, Jr.
patent: 5231051 (1993-07-01), Baldi et al.
patent: 5286344 (1994-02-01), Blalock et al.
patent: 5286677 (1994-02-01), Wu
patent: 5407698 (1995-04-01), Emesh

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for forming conductive lines and stacked vias does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for forming conductive lines and stacked vias, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for forming conductive lines and stacked vias will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-53921

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.