Method for forming an electrode

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257SE25032

Reexamination Certificate

active

07344967

ABSTRACT:
In a semiconductor light-emitting device, a buffer layer, a un-doped GaN layer, a high carrier concentration n+-layer, an n-type layer, an emission layer, a p-type layer, and a p-type contact layer are deposited in sequence on a sapphire substrate. The semiconductor light-emitting device includes a light-transparent electrode made of indium tin oxide (ITO) which is deposited in the low pressure vacuum chamber flowing at least oxygen gas through electron beam deposition or ion plating treatment, and a thermal process is carried out.

REFERENCES:
patent: 4482216 (1984-11-01), Hashimoto et al.
patent: 5157540 (1992-10-01), Kidai et al.
patent: 6351068 (2002-02-01), Yamazaki et al.
patent: 2004/0206961 (2004-10-01), Yamada et al.
patent: 2006/0225614 (2006-10-01), Hagiwara et al.
patent: 11-040854 (1999-02-01), None
patent: 2001-210867 (2001-08-01), None
patent: 2003-17748 (2003-01-01), None
patent: 10-2004-0065503 (2004-07-01), None
Korean Office Action dated Jul. 26, 2004 (with partial English translation).

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