Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-07-12
2005-07-12
Nguyen, Ha Tran (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S421000, C438S422000
Reexamination Certificate
active
06916735
ABSTRACT:
A temporary support layer2is formed on a semiconductor substrate1,and the temporary support layer2is provided with a hole4that reaches the semiconductor substrate1.The hole4is filled in with a conductor material5,and by pressurizing the conductor material5,the conductor material5and the semiconductor substrate1are pressure-bonded. Thereby, an aerial wiring structure whose bonding strength is improved and that has excellent self-sustainability can be obtained.
REFERENCES:
patent: 3850710 (1974-11-01), Wen
patent: 4263606 (1981-04-01), Yorikane
patent: 4939101 (1990-07-01), Black et al.
patent: 5654226 (1997-08-01), Temple et al.
patent: 6089442 (2000-07-01), Ouchi et al.
patent: 6130110 (2000-10-01), Hashimoto
patent: 6432239 (2002-08-01), Mandai et al.
patent: 11-126820 (1999-05-01), None
patent: 2004-514313 (2004-05-01), None
patent: 2002-0037070 (2002-05-01), None
Webster's dictionary, Houghton Mifflin Company, 1995, p. 875.
Fujikawa Takao
Yoshikawa Tetsuya
Kabushiki Kaisha Kobe Seiko Sho
Nguyen Ha Tran
LandOfFree
Method for forming aerial metallic wiring on semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for forming aerial metallic wiring on semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for forming aerial metallic wiring on semiconductor... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3371610