Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-04-18
2006-04-18
Nelms, David (Department: 2818)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C257S306000
Reexamination Certificate
active
07030015
ABSTRACT:
A method for forming a titanium nitride layer. A pre-heating step is performed, wherein a substrate is placed in a chamber comprising inert gas with a pre-heating pressure between 0.1˜3 torr. A TiN deposition step is then performed, wherein the substrate is placed in a reactive gas at least comprising NH3and TiCl4, and the first TiN deposition step has a reactive pressure of more than 5 torr and a reactive temperature of more than 500° C.
REFERENCES:
patent: 2005/0089634 (2005-04-01), Otsuki
Birch & Stewart Kolasch & Birch, LLP
Lee Calvin
Nelms David
Powerchip Semiconductor Corp.
LandOfFree
Method for forming a titanium nitride layer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for forming a titanium nitride layer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for forming a titanium nitride layer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3530582