Method for forming a film on a substrate by activating a reactiv

Coating processes – Direct application of electrical – magnetic – wave – or... – Plasma

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427573, 427575, 427576, 427578, 427579, 427596, 437 67, 437919, 148DIG50, B05D 306

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053857631

ABSTRACT:
A thin film forming method comprises the steps of supporting a semiconductor substrate having a trench or an unevenness thereon in a reaction vessel; introducing a reactive gas into the vessel; activating the reactive gas to form a deposit species, the deposit species characterized by a phase diagram including a liquid phase region defined by a melting curve and an evaporation curve that intersect at a triple point; and forming a thin film containing at least part of the deposit species on the substrate while retaining a pressure in the vessel higher than the triple point of the phase diagram of the deposit species, and retaining a temperature of the substrate within the liquid phase region of the phase diagram of the deposit species.

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patent: 4645564 (1987-02-01), Morie et al.
patent: 4673592 (1987-06-01), Porter et al.
patent: 4675205 (1987-06-01), Boncoeur et al.
patent: 4743570 (1988-05-01), Lamont, Jr.
patent: 4747928 (1988-05-01), Takahashi et al.
patent: 4800174 (1989-01-01), Ishihara et al.
Patent Abstract of Japan, vol. 15, No. 40, to Japanese Patent Document No. 02-277238 dated Jan. 30, 1991.

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