Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2011-03-08
2011-03-08
Smith, Zandra (Department: 2822)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C438S365000, C438S366000, C438S367000, C438S368000, C438S377000, C438S482000, C438S486000, C438S495000, C438S517000, C257S044000, C257S046000, C257S104000, C257S544000, C257S653000, C257SE31077, C257SE31090, C257SE27069, C257SE29090, C257SE29196
Reexamination Certificate
active
07902051
ABSTRACT:
The present invention, in one embodiment, provides a method of producing a PN junction the method including providing a single crystal substrate; forming an insulating layer on the single crystal substrate; forming a via through the insulating layer to provide an exposed portion of the single crystal substrate; forming amorphous Si on at least the exposed portion of the single crystal substrate; converting at least a portion of the amorphous Si into single crystal Si; and forming dopant regions in the single crystal Si. In one embodiment the diode of the present invention is integrated with a memory device.
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Happ Thomas
Lung Hsiang-Lan
Rajendran Bipin
Alexanian Vazken
International Business Machines - Corporation
Joy Jeremy J
Macronix International Co. Ltd.
Qimonda AG
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