Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having substrate registration feature
Reexamination Certificate
2011-06-14
2011-06-14
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Having substrate registration feature
C438S197000, C257SE21023, C257SE21598
Reexamination Certificate
active
07960242
ABSTRACT:
A method of manufacturing a semiconductor wafer, the method comprising: providing a base wafer comprising a semiconductor substrate, metal layers and first alignment marks; transferring a monocrystalline layer on top of said metal layers, wherein said monocrystalline layer comprises second alignment marks; and performing a lithography using an alignment based on a misalignment between said first alignment marks and said second alignment marks.
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Beinglass Israel
Cronquist Brian
de Jong Jan Lodewijk
Or-Bach Zvi
Sekar Deepak C.
Garber Charles D
MonolithIC 3D Inc.
Nikmanesh Seahvosh J
Sartori Michael A.
Venable LLP
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