Method for fabricating semiconductor devices having bit lines an

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438702, 438396, H01L 2170, H01L 2700

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active

056270950

ABSTRACT:
A method of manufacturing a semiconductor device, capable of securing an alignment margin between bit lines and a storage node contact is disclosed herein. The method includes: a depositing step of a first insulating layer on a semiconductor substrate of MOS structure; a forming step of a bit line pattern; a depositing step of a second insulating layer; a depositing step of sequentially a third and fourth insulating layers which have different etch rates; a masking and etching step of said fourth and third insulating layers to form T-shaped patterns in cross-sectional view; a forming step of polysilicon spacers at sidewalls of the T-shaped insulating patterns; a depositing step of a fifth insulating layer; a forming step of first photoresist mask pattern; etching steps of etching a predetermined portion of the fifth insulating layer, etching the T-shaped insulating layer pattern, etching the second insulating layer, etching the bit line pattern and etching the first insulating layer; a forming step of bit line contact; a depositing step of a sixth insulating layer; a forming step of second photoresist mask pattern for forming storage node contact hole on the sixth insulating layer and a forming step of a storage node contact hole by etching the predetermined portions of the sixth and fifth insulating layers, the T-shaped pattern, and the second and first insulating layer, sequentially.

REFERENCES:
patent: 5424235 (1995-06-01), Nishihara
patent: 5470776 (1995-11-01), Ryou
patent: 5492851 (1996-02-01), Ryou

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