Method for fabricating microstructure and microstructure

Etching a substrate: processes – Gas phase etching of substrate – Etching inorganic substrate

Reexamination Certificate

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Details

C216S058000, C216S075000, C216S099000, C438S719000

Reexamination Certificate

active

07833430

ABSTRACT:
A method of making a microstructure with thin wall portions (T1-T3) includes a step of performing a first etching process to a material substrate having a laminate structure including a first conductive layer (11) and a second conductive layer (12) having a thickness of the thin wall portions (T1-T3), where the etching is performed from the side of the first conductive layer (11) thereby forming in the second conductive layer (12) pre thin wall portions (T1′-T3′) which has a pair of side surfaces apart from each other in an in-plane direction of the second conductive layer (12) and contact the first conductive layer (11). The method also includes a step of performing a second etching process from the side of the first conductive layer (11) for removing part of the first conductive layer (11) contacting the pre thin wall portions (T1′-T3′) to form the thin wall portions.

REFERENCES:
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patent: 6287885 (2001-09-01), Muto et al.
patent: 6942814 (2005-09-01), Wood et al.
patent: 2002/0159170 (2002-10-01), Tsuboi et al.
patent: 10-190007 (1998-07-01), None
patent: 10-270714 (1998-10-01), None
patent: 2000-31502 (2000-01-01), None
patent: 2002-267996 (2002-09-01), None
patent: 2003-15064 (2003-01-01), None
patent: 2003-57574 (2003-02-01), None

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