Method for fabricating MEMS device

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Physical stress responsive

Reexamination Certificate

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Details

C438S050000, C438S052000, C257SE21499

Reexamination Certificate

active

08030112

ABSTRACT:
A method for fabricating MEMS device includes: providing a single crystal substrate, having first surface and second surface and having a MEMS region and an IC region; forming SCS mass blocks on the first surface in the MEMS region; forming a structural dielectric layer over the first surface of the substrate, wherein a dielectric member of the structural dielectric layer is filled in spaces surrounding the SCS mass blocks in the MEMS region, the IC region has a circuit structure with an interconnection structure formed in the structural dielectric layer; patterning the single crystal substrate by an etching process on the second surface to expose a portion of the dielectric member filled in the spaces surrounding the SCS mass blocks; performing isotropic etching process at least on the dielectric portion filled in the spaces surrounding the SCS mass blocks. The SCS mass blocks are exposed to release a MEMS structure.

REFERENCES:
patent: 6458615 (2002-10-01), Fedder et al.
patent: 6939473 (2005-09-01), Nasiri et al.
patent: 7026184 (2006-04-01), Xie et al.
patent: 7169323 (2007-01-01), Parent et al.
patent: 7250353 (2007-07-01), Nasiri et al.
patent: 7458263 (2008-12-01), Nasiri et al.
patent: 2004/0207074 (2004-10-01), MacDonald et al.

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