Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-11-22
2009-02-03
Lebentritt, Michael S (Department: 2829)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S603000, C438S604000, C438S660000, C438S758000, C438S761000, C257SE21030, C257SE21171, C257SE21585, C257SE23016, C257SE23019
Reexamination Certificate
active
07485560
ABSTRACT:
An amorphous silicon (Si) film is taken to form a metal silicide of Si—Al(aluminum) under a high temperature. Al atoms is diffused into the amorphous Si film for forming the metal silicide of Si—Al as nucleus site. Then through heating and annealing, a microcrystalline or nano-crystalline silicon thin film is obtained. The whole process is only one process and is done in only one reacting chamber.
REFERENCES:
patent: 5179042 (1993-01-01), Mikoshiba et al.
patent: 5208187 (1993-05-01), Tsubouchi et al.
patent: 5302855 (1994-04-01), Matsumoto et al.
patent: 6004885 (1999-12-01), Hayakawa et al.
Lan Shan-Ming
Yang Tsun-Neng
Atomic Energy Council - Institute of Nuclear Energy Research
Lebentritt Michael S
Troxell Law Office PLLC
LandOfFree
Method for fabricating crystalline silicon thin films does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for fabricating crystalline silicon thin films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating crystalline silicon thin films will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4099065