Semiconductor device manufacturing: process – Making passive device – Trench capacitor
Reexamination Certificate
2006-01-24
2006-01-24
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Making passive device
Trench capacitor
C438S243000, C438S245000
Reexamination Certificate
active
06989311
ABSTRACT:
The instant invention is a method for fabricating a trench contact to a deep trench capacitor with a polysilicon filling in a trench hole formed in a silicon substrate. An epitaxy process is performed to selectively grow silicon above the polysilicon filling in the trench hole. An opening leading to the polysilicon filling is anisotropically etched into the epitaxially grown silicon. The opening has lateral dimensions that are smaller than those of the polysilicon filling, and the opening is filled with polysilicon.
REFERENCES:
patent: 5365097 (1994-11-01), Kenney
patent: 5744386 (1998-04-01), Kenney
patent: 5843820 (1998-12-01), Lu
patent: 6171961 (2001-01-01), Yamazaki et al.
Schrems Martin
Temmler Dietmar
Wich-Glasen Andreas
Fourson George
Greenberg Laurence A.
Infineon - Technologies AG
Locher Ralph E.
Maldonado Julio
LandOfFree
Method for fabricating a trench contact to a deep trench... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for fabricating a trench contact to a deep trench..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating a trench contact to a deep trench... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3591074