Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2006-09-25
2009-06-30
Rose, Kiesha L (Department: 4116)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S149000, C438S151000
Reexamination Certificate
active
07553711
ABSTRACT:
In a fabrication method of a thin film transistor, a gate electrode is patterned with a first mask and an active pattern and a photoresist pattern are formed with a second mask. The photoresist pattern is ashed based on a predetermined width of an etch stopper. An insulating layer underlying the ashed photoresist pattern is patterned to form the etch stopper. In the fabrication method, the etch stopper may function as a passivation layer and is formed on an active layer of a thin film transistor part.
REFERENCES:
patent: 6664149 (2003-12-01), Shih
patent: 2005/0221546 (2005-10-01), Lee et al.
patent: 2007/0042537 (2007-02-01), Lee
Brinks Hofer Gilson & Lione
LG. Display Co. Ltd.
Rose Kiesha L
Shook Daniel
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