Semiconductor device manufacturing: process – Chemical etching
Reexamination Certificate
2007-09-11
2007-09-11
Ahmed, Shamim (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
C438S133000, C438S135000, C438S138000, C438S494000, C438S495000, C257S107000, C257S110000, C257S133000, C257S655000, C257S657000
Reexamination Certificate
active
11207525
ABSTRACT:
A method for fabricating a semiconductor and at least one second semiconductor zone of a semiconductor component having a semiconductor body having a first semiconductor zone. At least one field zone arranged in an edge region of the semiconductor body is reduced in size by means of an etching method. In another embodiment, the semiconductor body is partially removed in a region outside the first semiconductor zone. At least one second semiconductor zone is then fabricated in the partially removed region.
REFERENCES:
patent: 6110763 (2000-08-01), Temple
patent: 6162695 (2000-12-01), Hwang et al.
patent: 59075658 (1984-04-01), None
patent: 00/38242 (2000-06-01), None
patent: 02/49114 (2002-06-01), None
B. Jayant Baliga, “Power Semiconductor Devices”, PWS Publishing Company Boston 1996, pp. 82-99.
Barthelmess Reiner
Falck Elmar
Niedernostheide Franz-Josef
Schulze Hans-Joachim
Ahmed Shamim
Angadi Maki
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
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