Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-04-25
2006-04-25
Coleman, W. David (Department: 2823)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S637000, C438S700000
Reexamination Certificate
active
07033955
ABSTRACT:
The present invention discloses a method for fabricating a semiconductor device wherein precursor and deposition conditions of a bit line hard mask nitride film and a spacer nitride film are varied so that the nitride films are formed to have different etching ratios for sufficient protection of the bit line during an SAC process.
REFERENCES:
patent: 6316349 (2001-11-01), Kim et al.
patent: 6803318 (2004-10-01), Qiao et al.
Lee Kyung Won
Nam Ki Won
Coleman W. David
Heller Ehrman LLP
Hynix / Semiconductor Inc.
Tobergte Nicholas J
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