Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – On insulating substrate or layer
Reexamination Certificate
2005-03-29
2005-03-29
Mulpuri, Savitri (Department: 2812)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
On insulating substrate or layer
C438S481000, C117S105000
Reexamination Certificate
active
06872636
ABSTRACT:
A semiconductor device fabricating method includes the step of supplying BCl3as a doping gas, SiH4as a film forming gas, and H2as a carrier gas to a reaction chamber of a semiconductor device fabricating apparatus, wherein SiH4, BCl3and H2flow in the reaction chamber on the condition that the film forming pressure ranges from about 0.1 to 100 Pa and the film forming temperature ranges from about 400 to 700° C.
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Inokuchi Yasuhiro
Kunii Yasuo
Moriya Atsushi
Noda Takaaki
Bacon & Thomas PLLC
Hitachi Kokusai Electric Inc.
Mulpuri Savitri
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