Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2005-07-12
2005-07-12
Huff, Mark F. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
C430S316000, C430S319000, C430S328000, C430S329000
Reexamination Certificate
active
06916597
ABSTRACT:
A thin film to be milled is formed on a substrate1, and thereafter, a polymethylglutarimide layer and a photoresist layer are coated. Then, the photoresist layer is exposed and developed via a given mask, to form a pre-resist pattern. Then, ashing treatment is performed for the pre-resist pattern to a narrowed resist pattern. Subsequently, the thin film to be milled is milled via the resist pattern to obtain a patterned thin film.
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Kamijima Akifumi
Watanabe Hisayoshi
Huff Mark F.
Oliff & Berridg,e PLC
Ruggles John
TDK Corporation
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