Method for fabricating a local interconnection structure

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438634, 438643, 438648, 438649, 438720, 438724, H01L 21283, H01L 21306

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active

057504385

ABSTRACT:
A local interconnection structure is disclosed. The local interconnection structure is formed on a silicon substrate in which a polysilicon gate and a number of diffusion regions exist. The structure includes a number of metal silicide layers over the substrate, a metal nitride layer over the silicide layers, and a dielectric layer over the nitride layer. The metal nitride layer which electrically connects the diffusion regions and the gate forms the interconnection. The method for fabricating the interconnection structure includes the steps of preparing the silicon substrate, sputtering a metal layer, annealing to form silicide and the nitride layers, depositing the dielectric layer, and patterning the nitride layer and the metal nitride by covering with a mask, etching away portions of both the dielectric layer and metal nitride layer not covered by the mask, and removing the mask after etching.

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patent: 5420071 (1995-05-01), Burke
patent: 5508212 (1996-04-01), Wang et al.
patent: 5510292 (1996-04-01), Hayashi

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