Method for fabricating a group III nitride semiconductor...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Mesa formation

Reexamination Certificate

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C438S022000

Reexamination Certificate

active

07015058

ABSTRACT:
A nitride semiconductor laser device using a group III nitride semiconductor also as a substrate offers excellent operation characteristics and a long laser oscillation life. In a layered structure of a group III nitride semiconductor formed on a GaN substrate, a laser optical waveguide region is formed elsewhere than right above a dislocation-concentrated region extending so as to vertically penetrate the substrate, and electrodes are formed on the top surface of the layered structure and on the bottom surface of the substrate elsewhere than right above or below the dislocation-concentrated region. In a portion of the top surface of the layered structure and in a portion of the bottom surface of the substrate right above and below the dislocation-concentrated region, dielectric layers may be formed to prevent the electrodes from making contact with those regions.

REFERENCES:
patent: 6468347 (2002-10-01), Motoki et al.
patent: 6667184 (2003-12-01), Motoki et al.
patent: 6821805 (2004-11-01), Nakamura et al.
patent: 2003/0145783 (2003-08-01), Motoki et al.
patent: WO 03/034560 (2003-04-01), None
patent: WO 03/038957 (2003-05-01), None

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