Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Patent
1996-09-03
2000-04-11
Chang, Joni
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
438240, H01L 2100
Patent
active
060487372
ABSTRACT:
A ferroelectric capacitor taking a multilayer structure wherein a conductive oxide layer which is formed between a metal electrode and a ferroelectric layer, capable of enhancing the fatigue behavior in addition to reducing the leakage current. The multilayer structure can be fabricated by depositing a silicon oxide (SiO.sub.2) layer, an adhesive layer, a bottom metal layer, a lower conductive oxide layer, a ferroelectric layer, an upper conductive oxide layer and a top metal electrode layer are deposited over a silicon substrate, in sequence.
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Chung Chi-won
Chung Il-sub
Desu Seshu B.
Yoo In-kyung
Chang Joni
Lee, Esq. Eugene M.
Samsung Electronics Co,. Ltd.
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