Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2005-09-06
2005-09-06
Miriam, Daniel (Department: 2621)
Image analysis
Pattern recognition
Feature extraction
Reexamination Certificate
active
06941015
ABSTRACT:
The present invention relates to a method for extracting a Zernike/Pseudo-Zernike moment, and in particular, to a method for extracting a Zernike/Pseudo-Zernike moment by using the symmetry of a Zernike/Pseudo-Zernike moment basis function and computer readable recording medium on which a program implementing the same method is recorded. The method of the invention includes the steps of: generating a Zernike/Pseudo-Zernike moment in a predetermined quadrant on plane Cartesian coordinates; obtaining a pixel value of the input image by projecting the input image onto the quadrant; and multiplying each pixel value of the input image by the moment basis function corresponding to the pixel position and then summing the results thereof. Therefore, it is possible to extract a Zernike/Pseudo-Zernike moment in real time. In addition, system loads can be reduced more substantially by decreasing memory utilization during moment extraction to ¼, as compared to the conventional art.
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Hwang Sun Kyoo
Kim Hoel Wyul
Fleshner & Kim LLP
Miriam Daniel
LandOfFree
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