Method for exposing photoresist

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438654, 438657, 438636, 438720, H01L 21465

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active

058541322

ABSTRACT:
A method for patterning a polysilicon layer includes creating a TiN layer above an amorphous silicon (a-Si) layer forming a TiN/a-Si stack. The TiN/a-Si stack is formed above the polysilicon layer. The TiN layer serves as an ARC to reduce overexposure of the photoresist used to pattern the polysilicon layer, while the a-Si layer prevents contamination of the layer below the polysilicon layer.

REFERENCES:
patent: 4529685 (1985-07-01), Borodovsky
patent: 4707721 (1987-11-01), Ang et al.
patent: 4804636 (1989-02-01), Groover, III et al.
patent: 4820611 (1989-04-01), Arnold, III et al.
patent: 4897368 (1990-01-01), Kobushi et al.
patent: 5001108 (1991-03-01), Taguchi
patent: 5034348 (1991-07-01), Hartswick et al.
patent: 5065220 (1991-11-01), Paterson et al.
patent: 5091763 (1992-02-01), Sanchez
patent: 5219788 (1993-06-01), Abernathey et al.
patent: 5302538 (1994-04-01), Ishikawa et al.
patent: 5312780 (1994-05-01), Nanda et al.
patent: 5335204 (1994-08-01), Matsuo et al.
patent: 5441914 (1995-08-01), Taft et al.
patent: 5580701 (1996-12-01), Lur et al.
patent: 5626967 (1997-05-01), Pramanick et al.
Rocke, et al., "Titanium Nitride for Antireflection Control and Hillock Suppression on Aluminum Silicon Metallization", Journal of Vacuum Science & Technology, Part B, vol. 6, No. 4, Jul./Aug. (1988), New York, US.
S. Wolf et al "Silicon Processing for the VLSI Era, vol.I" Lattice Press (Calif.) (1986) p. 323.
H. J. Dijkstra, et al. "Optimization of Anti-Reflection Layers for Deep-UV Lithography" Proc. of the SPIE (Mar. 1993), vol. 1927 pt.1, pp. 275-286 vol. I, (abstract Only).

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