Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-11-14
1998-07-28
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324716, 324719, G01R 2726
Patent
active
057867054
ABSTRACT:
A substantially constant current is conducted in a first direction through an interconnect structure having a barrier layer to determine the lifetime of the structure in the first current direction. A substantially identical current is conducted in a second direction through a substantially identical interconnect structure to determine the lifetime of the structure in the second current direction. These tests are repeated for identical structures but having different barrier layer thicknesses. The results of these lifetime tests are compared to determine the barrier layer's effect on electromigration in the structure, which can be used to design the barrier layer to optimize the structure's lifetime and speed.
REFERENCES:
patent: 3474530 (1969-10-01), Ainslie et al.
patent: 3878442 (1975-04-01), Bhatt
patent: 4483629 (1984-11-01), Schwarz et al.
patent: 4652812 (1987-03-01), Gimpelson et l.
patent: 4970574 (1990-11-01), Tsunenari
patent: 5291142 (1994-03-01), Ohmi
patent: 5420513 (1995-05-01), Kimura
Bui Nguyen Duc
Pham Van
Yue John T.
Advanced Micro Devices , Inc.
Kwok Edward C.
Nguyen Vinh P.
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