Method for enhancing the diagnostic accuracy of a VLSI chip

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Reexamination Certificate

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07831863

ABSTRACT:
A diagnostic process applicable to VLSI designs to address the accuracy of diagnostic resolution. Environmentally based fail data drives adaptive test methods which hone the test pattern set and fail data collection for successful diagnostic resolution. Environmentally based fail data is used in diagnostic simulation to achieve a more accurate environmentally based fault callout. When needed, additional information is included in the process to further refine and define the simulation or callout result. Similarly, as needed adaptive test pattern generation methods are employed to result in enhanced diagnostic resolution.

REFERENCES:
patent: 4817093 (1989-03-01), Jacobs et al.
patent: 2001/0003427 (2001-06-01), Ferguson et al.
patent: 2004/0216061 (2004-10-01), Floyd et al.
patent: 2005/0010890 (2005-01-01), Nehmadi et al.
patent: 2006/0041813 (2006-02-01), Rajski et al.
patent: 2006/0066338 (2006-03-01), Rajski et al.
Search Report and Written Opinion. International Serial No. PCT/US08/50595.

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