Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2007-01-11
2010-11-09
Bonzo, Bryce P (Department: 2113)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
Reexamination Certificate
active
07831863
ABSTRACT:
A diagnostic process applicable to VLSI designs to address the accuracy of diagnostic resolution. Environmentally based fail data drives adaptive test methods which hone the test pattern set and fail data collection for successful diagnostic resolution. Environmentally based fail data is used in diagnostic simulation to achieve a more accurate environmentally based fault callout. When needed, additional information is included in the process to further refine and define the simulation or callout result. Similarly, as needed adaptive test pattern generation methods are employed to result in enhanced diagnostic resolution.
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Kusko Mary P.
Maier Gary W.
Motika Franco
Tran Phong T.
Bonzo Bryce P
International Business Machines - Corporation
Riad Amine
Schnurmann H. Daniel
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