Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-03-20
2009-02-03
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07487478
ABSTRACT:
A method for dynamically adjusting parameter values of part heights to verify the distances between parts is provided. The method comprises, inputting multiple sets of limiting conditions for part heights through a setting interface; and verifying whether the parts are appropriately positioned in a circuit diagram according to the limiting conditions for part heights, thereby upgrading the quality of design of the printed circuit board and enhancing the reliability of electronic products.
REFERENCES:
patent: 6401233 (2002-06-01), Suzuki et al.
patent: 6415426 (2002-07-01), Chang et al.
patent: 6480991 (2002-11-01), Cho et al.
patent: 6725438 (2004-04-01), van Ginneken
Lin Ming-Hui
Tsai Chiu-Feng
Chiang Jack
Inventec C'orporation
Rabin & Berdo P.C.
Tat Binh C
LandOfFree
Method for dynamically adjusting parameter values of part... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for dynamically adjusting parameter values of part..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for dynamically adjusting parameter values of part... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4069419