Method for dicing semiconductor wafers

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Making plural separate devices

Reexamination Certificate

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Details

C438S458000, C438S460000, C438S462000

Reexamination Certificate

active

10725697

ABSTRACT:
A method is disclosed for dicing a wafer having a base material with a diamond structure. The wafer first undergoes a polishing process, in which a predetermined portion of the wafer is polished away from its back side. The wafer is then diced through at least one line along a direction at a predetermined offset angle from a natural cleavage direction of the diamond structure.

REFERENCES:
patent: 362105446 (1987-05-01), None

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