Method for determining the temperature of a memory cell from...

Details Method for determining the temperature of a memory cell from... Method for determining the temperature of a memory cell from...

2005-04-12

2005-04-12

Verbitsky, Gail (Department: 2859)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C374S152000, C365S212000

Reexamination Certificate

active

06877897

ABSTRACT:
The temperature of a semiconductor component is determined by way of a memory cell that includes a transistor and a capacitor. To that end, a signal is determined in dependence on a threshold voltage of the transistor and a value for the temperature of the transistor is determined in dependence on the signal.

REFERENCES:
patent: 3950991 (1976-04-01), Grass
patent: 4121461 (1978-10-01), Butler et al.
patent: 4924212 (1990-05-01), Fruhauf et al.
patent: 5873053 (1999-02-01), Pricer et al.
patent: 6130442 (2000-10-01), Di Zenzo et al.
Bonhaus, Joerg et al., English Abstract of DE 19829716 A1, (EPO, published Jan. 20, 2000).

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