Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-08-22
2006-08-22
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C703S016000, C703S019000, C702S179000, C702S125000, C702S181000, C702S118000, C702S189000, C714S033000, C714S700000, C714S741000, C324S532000, C324S535000, C324S617000, C324S076540, C324S076740
Reexamination Certificate
active
07096443
ABSTRACT:
A method of determining the critical path of a circuit includes first determining the paths, their mean path transit times and their path transit time fluctuations. Paths having similar statistical parameters are combined to form one path group. For each path group, a statistical group figure is, then, calculated and, for the totality of paths considered, a statistical total figure is calculated. Finally, the critical paths of the circuit are determined by taking into consideration the total figure, comparing the group figures at or above a critical path transit time Tc.
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Berthold Jörg
Eisele Martin
Lorch Henning
Greenberg Laurence A.
Infineon - Technologies AG
Kik Phallaka
Locher Ralph E.
Stemer Werner H.
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