Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1996-11-26
1998-04-14
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
Of surface reflection
356437, G01J 400
Patent
active
057399107
ABSTRACT:
A method and an analyzer for determining the concentration of and/or identifying a specific gas are described. The analyzer has a test chamber through which a gas sample is carried. The gas sample then passes across a first substrate on which a first coating and a second coating are arranged. The second coating is made of a substance which selectively absorbs a specific gas, or a specific group of gases. A light source directs a light beam with a pre-defined polarization at the substrate and coatings. Polarization of the ensuring reflected light beam changes due to reflection in and interaction with the coatings. This change is determined by a calculation unit by determining the reflected light beam's polarization in a photodetector. Adsorption causes polarization changes which are only related to the concentration of the specific gas which can accordingly be identified.
REFERENCES:
patent: 4906844 (1990-03-01), Hall
patent: 5107105 (1992-04-01), Isobe
patent: 5420680 (1995-05-01), Isobe et al.
patent: 5563707 (1996-10-01), Prass et al.
Pham Hoa Q.
Siemens Elema AB
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