Method for determining die placement based on global routing...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C703S001000, C257S202000

Reexamination Certificate

active

06880145

ABSTRACT:
A method for interconnecting a plurality of dies. The method generally includes receiving a plurality of interconnect requirements for the dies. The interconnect requirements may include a priority for each of a plurality of nets. A position and an angle for one of the dies relative to a substrate may be calculated in response to the interconnect requirements. A plurality of nets may then be routed among the dies and a plurality of substrate pads defining external connections for the substrate. The dies may be mounted to the substrate after routing has been finalized.

REFERENCES:
patent: 5543640 (1996-08-01), Sutherland et al.
patent: 5608638 (1997-03-01), Tain et al.
patent: 5634267 (1997-06-01), Farnworth et al.
patent: 5818114 (1998-10-01), Pendse et al.
patent: 6057169 (2000-05-01), Singh et al.
patent: 6064194 (2000-05-01), Farnworth et al.
patent: 6225143 (2001-05-01), Rao et al.
patent: 6319752 (2001-11-01), Tain et al.
patent: 6323559 (2001-11-01), Chan et al.
patent: 6376914 (2002-04-01), Kovats et al.
patent: 6515509 (2003-02-01), Baxter
patent: 20010003375 (2001-06-01), Kovats et al.
patent: 20020152055 (2002-10-01), Ito et al.

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