Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-03-29
2005-03-29
Flynn, Nathan J. (Department: 2826)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C324S252000, C257S048000, C257S467000, C257S797000, C438S018000, C374S178000, C374S183000, C073S777000
Reexamination Certificate
active
06873170
ABSTRACT:
The invention relates to a device and a method for detecting the reliability of integrated semiconductor components. The device includes a carrier substrate for receiving an integrated semiconductor component that will be examined, a heating element, and a temperature sensor. The temperature sensor has at least a portion of a parasitic functional element of the semiconductor component. As a result, reliability tests can be carried out in a particularly accurate and space-saving manner.
REFERENCES:
patent: 4165642 (1979-08-01), Lipp
patent: 4356379 (1982-10-01), Graeme
patent: 5195827 (1993-03-01), Audy et al.
patent: 5280237 (1994-01-01), Buks
patent: 5309090 (1994-05-01), Lipp
patent: 5406212 (1995-04-01), Hashinaga et al.
patent: 5414370 (1995-05-01), Hashinaga et al.
patent: 5436494 (1995-07-01), Moslehi
patent: 5751015 (1998-05-01), Corbett et al.
patent: 6255892 (2001-07-01), Gärtner et al.
patent: 198 41 202 (2000-03-01), None
Meijer, G.: “Thermal Sensor Based on Transistors”, Elsevier Sequoia, 1986, pp. 103-125.
Shideler, J. et al.: “A Systematic Approach to Wafer Level Reliability”, Solid State Technology, Mar. 1995, pp. 47, 48, 50, 52, 54.
Anonymous: “Method to Determine Substrate Potential and Chip Temperature”, Research Disclosure, Mar. 1990, No. 311, New York, XP-000104454.
R.A. Bianchi et al.: “CMOS-Compatible Temperature Sensor with Digital Output for Wide Temperature Range Applications”, Microelectronics Journal, No. 31, 2000, pp. 803-810.
Asam Wilhelm
Fazekas Josef
Hagen Jochen Von
Martin Andreas
Smeets David
Flynn Nathan J.
Greenberg Laurence A.
Infineon - Technologies AG
Locher Ralph E.
Stemer Werner H.
LandOfFree
Method for detecting the reliability of integrated... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for detecting the reliability of integrated..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for detecting the reliability of integrated... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3428099