4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Wilhelm Asam

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Device and method for detecting a reliability of integrated...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Method for detecting the reliability of integrated...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2741777

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