Image analysis – Histogram processing – With pattern recognition or classification
Reexamination Certificate
2006-11-21
2006-11-21
Tran, Phuoc (Department: 2624)
Image analysis
Histogram processing
With pattern recognition or classification
C382S254000
Reexamination Certificate
active
07139427
ABSTRACT:
When enhancing an input image consisting of a pattern-like image, unnatural and undesirable artifacts arise as a side effect. A method for detecting a pattern-like image includes steps of: obtaining a histogram h[x] of an input image; dividing the histogram h[x] into at least a first subset of samples and a second subset of samples; and determining whether the input image is a pattern-like image based on a relationship between a number n1of samples in the first subset of samples and a number n2of samples in the second subset of samples. The relationship can be incorporated into an equation for calculating a pattern-like image detection parameter r and this pattern-like image detection parameter r can be used to adaptively adjust the output of a video enhancement system so that the side effect can be avoided when a pattern-like image comes in.
REFERENCES:
patent: 6389177 (2002-05-01), Chu et al.
patent: 6901165 (2005-05-01), Egger et al.
patent: 6990219 (2006-01-01), Morimura et al.
Myers Dawes Andras & Sherman LLP
Samsung Electronics Co,. Ltd.
Sherman, Esq. Kenneth L.
Tran Phuoc
Zarrabian, Esq. Michael
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