Method for detecting operational errors in a tester for semicond

Details Method for detecting operational errors in a tester for semicond Method for detecting operational errors in a tester for semicond

1998-05-19

1999-08-17

Nguyen, Hoa T.

Excavating

371 212, 371 275, G11C 2900, G01R 3128

Patent

active

059404132

ABSTRACT:
A method for detecting operational errors in a tester of a test system for determining whether a semiconductor device is good or failed includes a diagnostic test having the step of periodically inputting data to the device and checking whether the data can be retrieved intact from the tester. If not, then an operational error may be present in the tester. The method requires that the diagnostic test be carried out after a predetermined number of devices has been tested, and that the data inputted to the device during the diagnostic test be inputted to every I/O pin of the device. The diagnostic test includes inputting a value of 0 to each I/O pin, and then comparing the output of the device to a predetermined expected value. The diagnostic test also includes inputting a value of 1 to each I/O pin, and similarly comparing the output to an expected value.

REFERENCES:
patent: 4985988 (1991-01-01), Littlebury
patent: 5130646 (1992-07-01), Kojima
patent: 5315972 (1994-05-01), Judy et al.
patent: 5465850 (1995-11-01), Kase

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