Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-05-30
2008-12-16
Wachsman, Hal D (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S069000, C702S193000, C713S340000
Reexamination Certificate
active
07467050
ABSTRACT:
A circuit for detecting noise events in a system with time variable operating points is provided. A first voltage, which is averaged over time, is compared to a second voltage. A signal is generated to instruct circuits within a processor to initiate actions to keep a voltage from drooping further.
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Douriet Daniel
Haridass Anand
Huber Andreas
O'Reilly Colm B.
Truong Bao G.
Glanzman Gerald H.
International Business Machines - Corporation
Salys Cas
Wachsman Hal D
Yee Duke W.
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